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BFM and BFD are both terms related to design for testing (DFT), which is a set of techniques that reduce the difficulty and cost associated with testing an integrated circuit1. BFM stands for bus functional model, which is a software model of a physical interface of the device under test (DUT). BFM simulates the behavior of the DUT on the attached bus and provides a logical interface for the test bench components23. BFD stands for boundary fault detection, which is a technique that detects faults on the boundary scan chain of the DUT. BFD uses a special test pattern generator and a signature analyzer to compare the expected and actual outputs of the scan chain . BFM and BFD are both useful tools for verifying the functionality and quality of the DUT in different scenarios.